SEM for the 21st Century: Scanning Ion Microscopy
نویسندگان
چکیده
منابع مشابه
Scanning electrochemical microscopy in the 21st centuryw
The invention of the scanning tunneling microscope in early 1980s almost coincided with the introduction of micron-sized ultramicroelectrodes (UMEs). Since that time, the idea of scanning electrochemical microscopy (SECM; the same abbreviation is also used for the device, i.e., the microscope) was in the air. Several groups employed small and mobile electrochemical probes to make measurements w...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
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ژورنال
عنوان ژورنال: Metallography, Microstructure, and Analysis
سال: 2012
ISSN: 2192-9262,2192-9270
DOI: 10.1007/s13632-012-0013-0