Simultaneous Assembly of Multiple Test Forms

Controlling Test Overlap Rate in Automated Assembly of Multiple Equivalent Test Forms

Assembling equivalent test forms with minimal test overlap across forms is important in ensuring test security. Chen and Lei (2009) suggested an exposure control technique to control test overlap-ordered item pooling on the fly based on the notion that test overlap rate – ordered item pooling for the first t examinees is a function of test overlap rate – ordered item pooling for the previous (t...

Comparisons between Classical Test Theory and Item Response Theory in Automated Assembly of Parallel Test Forms

The automated assembly of alternate test forms for online delivery provides an alternative to computer-administered, fixed test forms, or computerized-adaptive tests when a testing program migrates from paper/pencil testing to computer-based testing. The weighted deviations model (WDM) heuristic is particularly promising for automated test assembly (ATA) because it is computationally straightfo...

I I Simultaneous Test Procedures - Some Theory of Multiple Comparisons

Multiple Test Forms Construction based on Bees Algorithm

This paper proposes a new construction method of multiple test forms that applies a Bees Algorithm and a parallel computation technique to improve the computational costs of the traditional methods.

Test Power Reduction by Simultaneous Don’t Care Filling and Ordering of Test Patterns Considering Pattern Dependency

Estimating and minimizing the maximum power dissipation during testing is an important task in VLSI circuit realization since the power value affects the reliability of the circuits. Therefore during testing a methodology should be adopted to minimize power consumption. Test patterns generated with –D 1 option of ATALANTA contains don’t care bits (x bits). By suitable filling of don’t cares can...