Site-specific Specimen Preparation Technique for Atom Probe Analysis of Grain Boundaries
نویسندگان
چکیده
منابع مشابه
Progress of Three-dimensional Atom Probe Techniques for Analysis of Steel Materials —Development of Atom Probe Specimen Preparation Techniques for Site-specific Regions—
Three-dimensional atom probe (3DAP) is a very powerful tool which can investigate atomic positions of all alloying elements in steel with lattice-spacing spatial resolution. However, the very small analysis volume of 3DAP has limited its application field. To meet the needs for atomic-scale analyses of steel materials, advanced preparation techniques of a needle specimen tip including a site-sp...
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Atom-probe tomography (APT) provides atomic-scale spatial and compositional resolution that is ideally suited for the analysis of grain boundaries. The small sample volume analyzed in APT presents, however, a challenge for capturing mesoscale features, such as grain boundaries. A new site-specific method utilizing transmission electron microscopy (TEM) for the precise selection and isolation of...
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Atom-probe tomography (APT) is a quantitative technique that permits three-dimensional (3-D) spectroscopic characterization of interfaces and other nanometer-scale features within a material. Specimens for atom-probe tomography (APT) analysis of semiconductor devices and nanostructured materials are typically fabricated employing a focused ion beam (FIB) instrument [1 3] or a dual-beam FIB inst...
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Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a two-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph...
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The preparation of bicrystals with an aim to study grain boundary structure by high resolution electron microscopy (HREM) requires a careful approach. Primary attention needs to be directed towards the orientations of the crystals forming a boundary so that atomic resolution images of the bicrystai can be achieved by HREM. Mader, Necker and Bailuffi (1) have reviewed the limitations of present ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2006
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192760606394x