Spectral self-interference fluorescence microscopy
نویسندگان
چکیده
منابع مشابه
Spectral self-interference fluorescence microscopy
Spontaneous emission of fluorophores located close to a reflecting surface is modified by the interference between direct and reflected waves. The spectral patterns of fluorescent emission near reflecting surfaces can be precisely described with a classical model that considers the relative intensity and polarization state of direct and reflected waves depending on dipole orientation. An algori...
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Spectral Self-Interference Fluorescence Microscopy (SSFM) has been shown to allow nanometer-scale localization of fluorescent layers placed above a reflecting substrate. A MonteCarlo analysis is used to show how this high localization accuracy can still be expected at the low signal levels associated with single-molecule studies. Discrimination of fluorophores separated by a few tens of nanomet...
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We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the he...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2004
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.1786665