Spectroscopic Ellipsometry Applied in the Full p-i-n a-Si:H Solar Cell Device Configuration
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چکیده
منابع مشابه
Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices
Optimization of thin film photovoltaics (PV) relies on characterizing the optoelectronic and structural properties of each layer and correlating these properties with device performance. Growth evolution diagrams have been used to guide production of materials with good optoelectronic properties in the full hydrogenated amorphous silicon (a-Si:H) PV device configuration. The nucleation and evol...
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ژورنال
عنوان ژورنال: IEEE Journal of Photovoltaics
سال: 2015
ISSN: 2156-3381,2156-3403
DOI: 10.1109/jphotov.2014.2362294