Spectroscopic ellipsometry for low-dimensional materials and heterostructures

Abstract Discovery of low-dimensional materials has been great interest in physics and material science. Optical permittivity is an optical fingerprint electronic structures, thus it important parameter the study properties materials. Spectroscopic ellipsometry provides a fast, robust, noninvasive method for obtaining spectra newly discovered Atomically thin have extremely short vertical path length inside them, making spectroscopic unique, compared to traditional ellipsometry. Here, we introduce fundamentals two-dimensional (2D) review recent progress. We also discuss technical challenges future directions