Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy
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چکیده
منابع مشابه
Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy
Strain-compensated InGaAsP/InGaP superlattices are studied in crosssection by atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Undulations in the morphology of the (110) cross-sectional faces are observed, and are attributed to elastic relaxation of this surface due to underlying strain arising from thickness and compositional variations of the superlattice layers. Finite ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1998
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.121165