Structural Analysis of the Outermost Hair Surface Using TOF-SIMS with C<sub>60</sub> Depth Profiling Technique
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چکیده
منابع مشابه
Multi-dimensional TOF-SIMS analysis for effective profiling of disease-related ions from the tissue surface
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) emerges as a promising tool to identify the ions (small molecules) indicative of disease states from the surface of patient tissues. In TOF-SIMS analysis, an enhanced ionization of surface molecules is critical to increase the number of detected ions. Several methods have been developed to enhance ionization capability. However, how thes...
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ژورنال
عنوان ژورنال: e-Journal of Surface Science and Nanotechnology
سال: 2012
ISSN: 1348-0391
DOI: 10.1380/ejssnt.2012.234