Structural, Optical and Electrical Properties of HfO2 Thin Films Deposited at Low-Temperature Using Plasma-Enhanced Atomic Layer Deposition
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چکیده
منابع مشابه
Surface Passivation of Silicon Using HfO2 Thin Films Deposited by Remote Plasma Atomic Layer Deposition System
Hafnium oxide (HfO2) thin films have attracted much attention owing to their usefulness in equivalent oxide thickness scaling in microelectronics, which arises from their high dielectric constant and thermodynamic stability with silicon. However, the surface passivation properties of such films, particularly on crystalline silicon (c-Si), have rarely been reported upon. In this study, the HfO2 ...
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CdxZn8-xTe92chalcogenideglass is prepared by melt quenching technique. The thin films of as-prepared glass are deposited by thermal evaporation technique under the vacuum better than 10torr. The optical parameters such as refractive index (n), extinction coefficient (k), the absorption coefficient (α), and optical band gap (Eg) are calculated from transmittance spectra in the 200-1800nm region....
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ژورنال
عنوان ژورنال: Materials
سال: 2020
ISSN: 1996-1944
DOI: 10.3390/ma13092008