Study and Calculation Electrical Properties of Silver Thin Layers by Four- Point Probe Method
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چکیده
منابع مشابه
ELECTRICAL CHARACTERIZATION OF ALUMINUM (Al) THIN FILMS MEASURED BY USING FOUR- POINT PROBE METHOD
This paper reports the results of electrical characterization of aluminum thin films. Uniform Al thin films were deposited by physical vapor deposition (PVD) technique on glass substrates. The electrical resistivity of the films as a function of film thickness was studied. These parameters have been measured by four-point probe method. The electrical resistivity was obtained by the measurement ...
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15 صفحه اولطراحی و ساخت دستگاه four-point probe station
یکی از ویژگی های اساسی مواد هادی مقاومت الکتریکی آن هاست که با داشتن تعداد الکترونهای آزاد لایه ظرفیت می توان مقاومت الکتریکی آن ماده را پیدا نمود. با اندازه گیری مقاومت الکتریکی مواد می توان ویژگیها و مشخصات ماده را تعیین نمود. در این پایان نامه بنا داریم به اندازه گیری مقاومت الکتریکی با استفاده چهار پراب همراستا با فاصله ثابت از هم که در تماس با سطح یک ویفر سیلیکونی هستند اقدام کنیم. در عم...
Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy
We have measured the dielectric properties and thickness of thin semiconductor epitaxy layers by the reflection of THz radiation from the surface of a two-layered semiconductor wafer. When reflecting from two interfaces the electromagnetic pulse has a destructive interference at a specific wavelength dependent on the thickness of the outer layer and its dielectric function. Near that frequency ...
متن کاملStructural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
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ژورنال
عنوان ژورنال: Journal of Lasers, Optics & Photonics
سال: 2017
ISSN: 2469-410X
DOI: 10.4172/2469-410x.1000150