Studying the heterogeneity of the CrxTi1-xCh2 (Ch = S, Se) single crystals using X-ray scanning photoemission microscopy
نویسندگان
چکیده
The morphology of the heterogeneous CrxTi1-xSe2 and CrxTi1-xS2 single crystals has been studied using X-ray scanning photoemission microscopy (SPEM) angular resolved spectroscopy (ARPES). A direct method SPEM provided us insight into origin blurred ARPES images for Cr0.78Ti0.36Se2 crystal. Using SPEM, we confirmed formation CrSe2-based structural fragments inside with x ≥ 0.75. chemical composition forming depends on chalcogen (S, Se) crystal lattice.
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ژورنال
عنوان ژورنال: Journal of Physics and Chemistry of Solids
سال: 2022
ISSN: ['0369-8726', '0022-3697', '1879-2553']
DOI: https://doi.org/10.1016/j.jpcs.2021.110309