Synchrotron Radiation Stimulated Nano-process and Atom-Molecular Level Characterization
نویسندگان
چکیده
منابع مشابه
Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy.
We describe the application of scattering-type near-field optical microscopy to characterize various semiconducting materials using the electron storage ring Metrology Light Source (MLS) as a broadband synchrotron radiation source. For verifying high-resolution imaging and nano-FTIR spectroscopy we performed scans across nanoscale Si-based surface structures. The obtained results demonstrate th...
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Ask class: what does this mean about the total speed? Constant, of course. Ask class: how does the speed along the magnetic field change? It doesn’t, because the acceleration is all perpendicular to magnetic field. Since the total speed is constant and the speed along the field is constant, this implies circular motion around the field, combined with (possibly) a uniform drift along the field. ...
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ژورنال
عنوان ژورنال: The Review of Laser Engineering
سال: 1999
ISSN: 0387-0200,1349-6603
DOI: 10.2184/lsj.27.supplement_78