Synchrotron X-ray Micro-diffraction – Probing Stress State in Encapsulated Thin Silicon Solar Cells

Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction

Citation: Ali I, Tippabhotla SK, Radchenko I, Al-Obeidi A, Stan CV, Tamura N and Budiman AS (2018) Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction. Front. Energy Res. 6:19. doi: 10.3389/fenrg.2018.00019 Probing stress states in silicon nanowires During electrochemical lithiation Using In Situ synchrotron X-ray Microdi...

In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti-Ni-based thin films.

Deformation mechanisms of as-deposited and post-annealed Ti50.2Ni49.6, Ti50.3Ni46.2Cu3.5 and Ti48.5Ni40.8Cu7.5 thin films were investigated using the in situ synchrotron X-ray diffraction technique. Results showed that initial crystalline phases determined the deformation mechanisms of all the films during tensile loading. For the films dominated by monoclinic martensites (B19'), tensile stress...

Thin-film Silicon Solar Cells

The simplest semiconductor junction that is used in solar cells for separating photogenerated charge carriers is the p-n junction, an interface between the p-type region and ntype region of one semiconductor. Therefore, the basic semiconductor property of a material, the possibility to vary its conductivity by doping, has to be demonstrated first before the material can be considered as a suita...

Thermomechanical strain measurements by synchrotron x-ray diffraction and data interpretation for through-silicon vias

Dimension and liner dependent thermomechanical strain characterization of through-silicon vias using synchrotron x-ray diffraction

Strain measurements are demonstrated for through-silicon vias (TSVs) using synchrotron x-ray diffraction to characterize the effect of copper via dimensions and liner materials. Reduction in strains in the silicon around TSVs is observed for the TSVs with smaller via diameters and the TSVs with a thicker polymer liner. To interpret the measured two-dimensional (2D) TSV strain distribution maps ...