The Research on the Signal Generation Method and Digital Pre-Processing Based on Time-Interleaved Digital-to-Analog Converter for Analog-to-Digital Converter Testing

In the high-resolution analog circuit, performance of chips is an important part. The needs to be determined by testing. According test requirements, stimulus signal with better quality and necessary. main research direction how generate high-speed when there no suitable digital-to-analog converter (DAC) chip available. this paper, we take analog-to-digital (ADC) as example; article uses DAC multiplexers signals that can used for testing ADC based on principle time-alternating sampling. This explains its method, analyzes error proposes a digital pre-processing method reduce error. Finally, actual circuit designed, verified circuit. results prove effectiveness generating signals.