Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Journal of Solid-State Circuits
سال: 2004
ISSN: 0018-9200
DOI: 10.1109/jssc.2003.820873