Using march tests to test SRAMs

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March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs

Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing Static Random Access Memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technolog...

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[Proceeding] A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs

Among the different types of algorithms proposed to test Static Random Access Memories (SRAMs), March Tests have proven to be faster, simpler and regularly structured. A large number of March Tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of...

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Design and Test of Embedded SRAMs

Embedded SRAMs can occupy the majority of the chip area in SoCs. The increased process spreads of modern scaled-down technologies and non-catastrophic defect-related sensitivity to environmental parameters can compromise the stability of SRAM cells, which is quantified by a low Static Noise Margin (SNM). A Stability Fault (SF) can present itself in a cell whose SNM is so small that it can accid...

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Reducing Test Time of Embedded SRAMs

Compared with traditional functional fault models, fault model obtained from an Inductive Fault Analysis (IFA) test flow can provide an attractive basis for obtaining a good estimate of the overall test quality in terms of defect level and yield. However, the associated surging test time due to increased SRAM capacity is becoming a major challenge when testing either standalone or embedded SRAM...

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Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. Although several March Tests have been developed for the wide memory faults spread, a few of them are able to detect linked faults. In the present paper March AB, a March Test t...

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ژورنال

عنوان ژورنال: IEEE Design & Test of Computers

سال: 1993

ISSN: 0740-7475

DOI: 10.1109/54.199799