Validating S?parameter measurements of RF integrated circuits at milli?Kelvin temperatures

Techniques to precisely characterise RF components at milli-Kelvin temperatures support the development of quantum computing systems utilising these components. In this work, an S-parameter measurement setup integrated circuits has been proposed and for first time, measurements have validated using two independent calibration techniques, thereby providing more confidence in measurements. The techniques are demonstrated experimentally by comparing validating calibrated a cryogenic attenuator temperatures.