Versatile Application of Scanning Electron Microscope to Paper Specimens
نویسندگان
چکیده
منابع مشابه
the scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملA versatile multipurpose scanning probe microscope.
A combined scanning probe microscope has been developed that allows simultaneous operation as a non-contact/tapping mode atomic force microscope, a scattering near-field optical microscope, and a scanning tunnelling microscope on conductive samples. The instrument is based on a commercial optical microscope. It operates with etched tungsten tips and exploits a tuning fork detection system for t...
متن کاملScanning Electron Microscope A To Z
Since the Scanning Electron Microscope (SEM) was first commercialized about 40 years ago, the SEM has shown a remarkable progress. Now, many types of SEMs are being used, and their performance and functions are greatly different from each other. To utilize these different SEMs, it is essential to recognize their features, as well as to understand the reasons for the contrast of SEM images. Thus...
متن کاملA Versatile , Stable Scanning Proximal Probe Microscope
We present a novel scanning proximal probe microscope design utilizing a piezo-electric driven coarse positioning mechanism in x, y, and z, while maintaining relatively small lateral dimensions. The instrument is suitable for insertion into a dewar. The primary purpose of this work is to develop a stable yet versatile instrument in order to meet the signal averaging limitations imposed by low s...
متن کاملThe Application of GPGPU to Automatic Electron Gun Alignment in the Scanning Electron Microscope
Once trained, the human brain is an excellent image processor; to replicate that skill for scanning electron microscope (SEM) image assessment demands considerable computing power. We have evaluated parallel computing for this purpose and developed an image processing tool for the automatic optimisation of electron gun alignment. The instrumental setup for this work was a Carl Zeiss 1430VP SEM ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Sen'i Gakkaishi
سال: 1980
ISSN: 0037-9875,1884-2259
DOI: 10.2115/fiber.36.11_p449