Viscosity and elastic constants of amorphous Si and Ge

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Viscosity and elastic constants of amorphous Si and Ge

The biaxial modulus and coefficient of thermal expansion of ion-beam-sputtered amorphous Si and Ge thin films were determined from curvature changes induced by differential thermal expansion. Viscous flow was measured by stress relaxation and was found to be Newtonian. The viscosity increased linearly with time as a result of structural relaxation, and its isoconfigurational activation enthalpy...

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 1993

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.355031