Wafer-scale graphene quality assessment using micro four-point probe mapping
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Nanotechnology
سال: 2020
ISSN: 0957-4484,1361-6528
DOI: 10.1088/1361-6528/ab7677