An Iterative Heuristic for State Justi cation in Sequential Automatic Test Pattern Generation
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چکیده
State justi cation is one of the most timeconsuming tasks in sequential Automatic Test Pattern Generation (ATPG). For states that are diÆcult to justify, deterministic algorithms take signi cant CPU time without much success most of the time. In this work, we adopt a hybrid approach for state justication. A new method based on Genetic Algorithms is proposed, in which we engineer state justi cation sequences vector by vector. The proposed method is compared with previous GA-based approaches. Significant improvements have been obtained for ISCAS benchmark circuits in terms of state coverage and CPU time.
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تاریخ انتشار 2001