Application of moiré patterns to AR markers for high-accuracy pose estimation

AR markers are useful tool for easy recognition of pose and ID of target objects. However, they have poor accuracy in the orientation estimation, especially in the frontal direction. We solved the problem by a novel principle using variable moiré patterns. We developed two new AR markers which utilize moiré patterns of which the darkest part seems to move according to the visual-line angle of the observation. We can extract the orientaion information from the pattern by image processing. The developed markers and the processing algorithm enable high-accuracy orientation estimation even by the observation from the frontal direction.