Binary Versus Decade Inductive Voltage Divider Comparison and Error Decomposition
نویسندگان
چکیده
Absbacl-An automatic Inductive Voltage Divider ( I M ) characterization method that can measure linearity by comparing WD’s with differeut structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to assign independent errors due to the binary and decade structures with a 27 uncertainty of 0.05 parts per million (ppm) at the measured ratio values.
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تاریخ انتشار 2009