TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition

نویسندگان

  • Hiroshi Suzuki
  • Mauro Ciappa
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015