Imagi,ng of Diffraction Data by the Maximum Entropy Method -anew Approach to Crystallography-
چکیده
The recent works of the Maximum Entropy Method (MEM) in the field of accurate crystal structure analysis were reviewed, The role of MEM analysis in these works are described by the concept of Imaging of Diffraction Data (IDD). Assuming that the phase problem is solved by direct method or some other way, it is possible to construct the real space image, such as the electron density distribution in the case of X-ray diffraction or the nuclear density distribution in the case of neutron diffraction case, directly from the experimental diffraction data. This process can be done without using any crystal structural model. This fact may provide an approach to a new crystallography, in which all the analysis, such as anharmonicities, etc. can be done based on the real space images of diffraction data instead of the reciprocal quantities of structu re factors.