A New Low Power Bit-Interchanging TPG (BI -TPG) for Test per Scan BIST
نویسندگان
چکیده
A new test pattern generator to reduce the number of transition at scan input during scan shifting is proposed. The method is based on generating more correlative neighboring bits by interchanging adjacent bits in a test pattern. The proposed work is known as Bit Interchanging Teat Pattern Generator (BI-TPG) and it consists of basic XOR, XNOR, AND gates, 2:1 Multiplexer and a register. The length of the register is equal to the length of the scan cells. It reduces the shifting power at the scan cell. Experimental results on ISCAS’89 bench marks show minimum of 40% reduction in switching activity during test applications.
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تاریخ انتشار 2015