Inverse scattering for near-field scanning optical microscopy with broadband illumination
نویسندگان
چکیده
Inverse scattering for near-field scanning optical microscopy with broadband illumination Brynmor J. Davis, Jin Sun, John C. Schotland and P. Scott Carney* The Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois 61801, USA; Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA; Department of Bioengineering, University of Pennsylvania, Philadelphia, Pennsylvania, USA
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تاریخ انتشار 2010