Effects of Long-Range Tip-Sample Interaction on Magnetic Force Imaging: A Comparative Study Between Bimorph Driven System and Electrostatic Force Modulation
نویسنده
چکیده
Magnetic force microscopy (MFM) using electrostatic force modulation has been designed and developed to avoid the drawbacks of the bimorph driven system. The bimorph driven system has poor frequency response and overlap of the topographic features on magnetic structures of the MFM images. In the electrostatic force modulation system, the amplitude increases in the noncontact regime as the tip approaches due to the capacitive coupling between tip and sample. MFM using electrostatic force modulation has been applied to observe maze-like stripe domain structures on a CoCr film. The contrast mechanism and imaging stability of MFM using electrostatic force modulation are discussed by investigating the force distance curves obtained in two magnetic domain regions.
منابع مشابه
Atomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملDistinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topograp...
متن کاملPolarization effects in Non-Contact Atomic Force Microscopy: a key to model the tip-sample interaction above charged adatoms
We discuss the influence of short-range electrostatic forces, so called dipolar forces, between the tip of an atomic force microscope (AFM) and a surface carrying charged adatoms. Dipolar forces are of microscopic character and have their origin in the polarizability of the foremost atoms on tip and surface. In most experiments performed by non-contact AFM, other forces such as binding forces d...
متن کاملReversible short-range electrostatic imaging in frequency modulation atomic force microscopy on metallic surfaces
The mechanism of atomic-scale image formation in non-contact AFM on metallic surfaces is analysed using total-energy pseudopotential calculations. Depending on the tip–apex configuration, we find two different imaging modes. Both clean and metal contaminated Si tips provide atomic resolution arising from the very strong covalent tip–sample interaction, in striking similarity with the imaging me...
متن کاملTheoretical basis of parametric-resonance-based atomic force microscopy
Parametric resonance underpins the physics of swings, resonant surface waves, and particle traps. There is increasing interest in its potential applications in atomic force microscopy AFM . In this paper, the dynamics of parametrically resonant microcantilevers for high sensitivity imaging and force spectroscopy applications is investigated theoretically. Detailed numerical parametric-resonance...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2015