Solving the Phase Problem Using Reference-Beam X-Ray Diffraction
نویسنده
چکیده
A new method of obtaining Bragg reflection phases in an x-ray diffraction experiment is presented. It combines the phase-sensitive principles of multiple-beam diffraction and x-ray standing waves, and allows direct phase measurements of many multiple reflections simultaneously using a Bragg-inclined oscillating-crystal geometry. A modified-two-beam intensity function is devised to extract the phase information in a way similar to the standing wave analyses. [S0031-9007(98)05790-1]
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تاریخ انتشار 1956