Materials Analysis Using Synchrotron Radiation
نویسنده
چکیده
Synchrotron radiation (SR) is a tunable, highly oriented, intense X-ray. Its tunability has led to XAFS being used as a common analytical tool, and is particularly useful for examining local structures. In fact, its use is indispensable to the examination of not only amorphous materials or solutions but also multicomponent systems. Thanks to the high intensity of SR, it is possible to determine the structure or composition of very small areas or monolayers. Researchers who are faced with difficulties caused by the limits of conventional experimental techniques would be well advised to consider X-ray analysis using SR.
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تاریخ انتشار 2003