High-resolution X-ray computed tomography of through silicon vias for RF MEMS integrated passive device applications

نویسندگان

  • P. J. de Veen
  • C. Bos
  • D. R. Hoogstede
  • C. Th. A. Revenberg
  • J. Liljeholm
  • Thorbjorn Ebefors
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015