Test Data Generation based on Binary Search for Class-level Testing

One of the important tasks during software testing is the generation of appropriate test data. Various techniques have been proposed to automate this task. The techniques available, however, often have problems limiting their use. In the case of dynamic test data generation techniques, a frequent problem is that a large number of iterations might be necessary to obtain test data. This article proposes a novel technique for automated test data generation based on binary search. Binary search conducts searching tasks in logarithmic time, as long as its assumptions are fulfilled. This article shows that these assumptions can also be fulfilled in the case of path-oriented test data generation and presents a technique which can be used to generate test data covering certain paths in class methods.