Cu-Zn-Sn-S Thin Films from Electrodeposited Metallic Precursor Layers
نویسندگان
چکیده
Cyclic voltammogram of ionic liquid and metallic-salts in ionic liquids were recorded. Cu/Sn/Zn stacked layers were electrodeposited and subsequently sulfurized in a tube furnace in elemental sulfur at 550oC. Thin films were characterized by X-ray diffraction, ICP-MS, and SEM. The device was characterized by I-V, QE and Mott-Schottky (capacitance-voltage) plot.
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تاریخ انتشار 2012