The new ProfileView Software for Beam Induced Fluorescence Monitors

GSI accelerators are currently equipped with four Beam Induced Fluorescence (BIF) monitors. They determine the transverse beam profiles without beam disturbance by detecting the fluorescence light generated by excitation of a working gas (N2) with the passing ion beam. Therefore, they are well suited to observe the beam at multiple positions simultaneously [1]. The fluorescence photons are detected by two microchannel plate (MCP) based image intensifier systems using FireWire CCD cameras to determine the horizontal and vertical beam profile. Each camera lens has a remote controllable iris to adjust the number of photons hitting the photo cathode of the intensifier system. Irises and MCP amplification are controlled by an Ethernet connected DAC electronics. Additionally, each BIF monitor comprises a pressure control unit to inject defined gas pressures into the beam pipe and a timing decoder to trigger the cameras and the MCPs.