X-Gen: a random test-case generator for systems and SoCs

نویسندگان

  • Roy Emek
  • Itai Jaeger
  • Yehuda Naveh
  • Gadi Bergman
  • Guy Aloni
  • Yoav Katz
  • Monica Farkash
  • Igor Dozoretz
  • Alex Goldin
چکیده

We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoCs). XGen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. XGen is currently in preliminary use at IBM for the verification of two different designs—a high-end multi-processor server and a state-of-the-art SoC.

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تاریخ انتشار 2002