نتایج جستجو برای: c control chart

تعداد نتایج: 2291420  

Angellys P. Ariza Guerrero Rister Barreto Pombo Roberto J. Herrera Acosta

Water pH and active ingredient concentration are two of the most important variables to consider in the manufacturing process of fungicides. If these variables do not meet the required standards, the quality of the product may be compromised and lead to poor fungicide performance when water is used as the application carrier, which is in most cases. Given the correlation between the variable...

The CCC-r chart is developed based on cumulative count of a conforming (CCC) control chart that considers the cumulative number of items inspected until observing r nonconforming ones. Typically, the samples obtained from the process are analyzed through 100% inspection to exploit the CCC-r chart. However, considering the inspection cost and time would limit its implementation. In this paper, w...

Journal: :iranian journal of science and technology (sciences) 2014
m. riaz

in statistical quality control a very widely used measure is average run length (arl) which may be worked out by different methods like integral equation, approximations, and monte carlo simulations. the arl measure and the other related measures are of major significance in every type of production process. an omission in its computation (and hence its related measures such as extra quadratic ...

In many processes in real practice at the start-up stages the process parameters are not known a priori and there are no initial samples or data for executing Phase I monitoring and estimating the process parameters. In addition, the practitioners are interested in using one control chart instead of two or more for monitoring location and variability of processes. In this paper, we consider a s...

2004
Leeing Tong Hsingyin Lee Chifeng Huang Changke Lin Chienhui Yang

The wafer defects influence the yield of a wafer. The integrated circuits (IC) manufacturers usually use a Poisson distribution based c-chart to monitor the lot-to-lot wafer defects. As the wafer size increases, defects on wafer tend to cluster. When the c-chart is used, the clustered defects frequently cause erroneous results. The main objective of this study is to develop a hierarchical adapt...

Statistical process control methods for monitoring processes with univariate ormultivariate measurements are used widely when the quality variables fit to known probabilitydistributions. Some processes, however, are better characterized by a profile or a function of qualityvariables. For each profile, it is assumed that a collection of data on the response variable along withthe values of the c...

Saghaei, A., Shokrizadeh, R., Yaquninejad , Y.,

When the objective is quick detection both small and large shifts in the process mean with normal distribution, the generalized likelihood ratio (GLR) control charts have better performance as compared to other control charts. Only the fixed parameters are used in Reynolds and Lou’s presented charts. According to the studies, using variable parameters, detect process shifts faster than fixed pa...

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