Load-displacement curves measured during indentation experiments on thin films depend on non-homogeneous intrinsic film microstructure and residual stress gradients as well as on their changes during indenter penetration into the material. To date, microstructural changes and local stress concentrations resulting in plastic deformation and fracture were quantified exclusively using numerical mo...

Abstract Current three-body abrasive wear theories are based on a macroscale indentation process, and these claim that material cannot be achieved without damaging the hard mating surface. In this study, process of nano-abrasive system including single crystalline silicon substrate, an amorphous silica cluster, polyurethane pad, chemical mechanical polishing (CMP) is investigated via molecular ...

This paper presents a constitutive modelling technique for the multi-phase transformations in mono-crystalline silicon under complex loading. The development is based on the physical mechanisms observed experimentally and the incremental theory of plasticity. The stress–strain relationship is derived using closed loading/unloading surfaces, associated flow rule and isotropic hardening rule, to ...

A thermal stress range analysis of tungsten-rhenium thin film thermocouples based on ceramic substrates is presented to analyze the falling off and breakage problems caused by the mismatch of the thermal stresses in thin film thermocouples (TFTCs) and substrate, and nano-indentation experiments are done to measure and calculate the film stress to compare with the simulation results. Optimal des...

This paper presents a dislocation-based yield strength model for the nano-indentation size effect. The is based on functional expressions involving densities of statistically stored dislocations and geometrically necessary dislocations. A single-phase austenitic stainless steel (316L) ferrite-austenite dual-phase (2205) are used here as case-study materials to validate proposed model. Experimen...

PeakForce Quantitative Nanomechanical Mapping (QNM) is a new atomic force microscopy technique for measuring the Young’s modulus of materials with high spatial resolution and surface sensitivity, by probing at the nanoscale. In the present work, modulus results from PeakForceTM QNMTM using three different probes are presented for a number of different polymers with a range of Young’s moduli tha...