the aim of this study was a sociological analysis of nima’s barf poem, based on shariati’s viewpoints in art by emphasise on sorrow concept. shariati has a critical-utopian approach bout art-society relation. he believes that this approach is available in modern art. his definition of modern art, like to adorno, has an allusion to harbinger art movement in 20 century beginning.  although sharia...

If we accept this idea that in talking about art, there is a chasm between thought and unthought debating on art theory in the sociohistorical context of after revolutionary Iran requires at least two items in which understanding and creating art meet one another: 1) Art as door separates intelligible from sensible, rational from irrational, and logos from pathos as well and 2) Art as brid...

Background Preterm birth is the most important factor in neonatal morbidity and mortality. In the case of pregnancy with assisted reproductive technology (ART) we have more percentage of multiple pregnancies which is a strong reason for preterm birth and low birth weight so suggested that ART can affect neonatal outcomes. In this article we searched about neonatal outcomes in ART pregnancies. M...

There are six surviving manuscripts under the category of Subika namely Subika, Achouba, Laishaba, Choudit, Cheithil, and Thengrakhel Subika. For this paper manuscript “Subika Laishaba'' has been discussed. Illustration Laishaba is painting among earliest visual arts forms Manipur. Though advent paintings lately acquired from various individual collections, possesses an interesting area studyin...

Fault testing of resistive manufacturing defects is done on a recently developed single event upset immune logic family. Resistive ranges and delay times are compared with those of traditional CMOS logic. Reaction of the logic to these defects is observed for a NOR gate and an evaluation of its ability to cope with them is determined.

In this paper we have performed TCAD simulations of 1T-NOR Flash electrical characteristics after 1 million cycles program/erase (P/E) operations. Thanks to the simulation, spatial defect distributions been proposed explain endurance degradation. Process simulation was based on a 90 nm node embedded non-volatile memory technology (eNVM) produced at STMicroelectronics. Hot carrier injection (HCI...