نتایج جستجو برای: semiconductor device testing

تعداد نتایج: 1029873  

Journal: :Journal of the Visualization Society of Japan 2005

Journal: :Solid-state Electronics 2021

• Low-saturation current PureB Si diodes with B-deposition from 50 °C to 700 °C. Robust chemical and electrical behavior coupled B-bonding structure at interface. PureGa only Ga wetting layers 400 are electrically similar diodes. A layer before B deposition (PureGaB) gives better robustness than 4-nm-thin PureGaB can be contacted Al while alone Schottky formation. Nanolayers of pure boron (Pure...

Journal: :IEEE Transactions on Electron Devices 2022

Journal: :Computers & Mathematics with Applications 1993

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