نتایج جستجو برای: semiconductor device testing

تعداد نتایج: 1029873  

2003
Leon M. Tolbert Syed K. Islam Anne Mayhew Madhu Sudhan Chinthavali

With the increase in use of power electronics in transmission and distribution applications there is a growing demand for cost effective and highly efficient converters. Most of the utility applications have power electronics integrated in the system to improve the efficiency and functionality of the existing system. The development of semiconductor devices is vital for the growth of power elec...

2012
Faten Adel Ismael Chaqmaqchee Naci Balkan Jose Maria Ulloa Herrero

The Top-Hat hot electron light emission and lasing in semiconductor heterostructure (HELLISH)-vertical cavity semiconductor optical amplifier (VCSOA) is a modified version of a HELLISH-VCSOA device. It has a shorter p-channel and longer n-channel. The device studied in this work consists of a simple GaAs p-i-n junction, containing 11 Ga0.35In0.65 N0.02As0.08/GaAs multiple quantum wells in its i...

Journal: :IEEE Transactions on Semiconductor Manufacturing 1999

2002
V. K. Dugaev Yu. Vygranenko M. Vieira V. I. Litvinov J. Barnaś Emidio Navarro

We propose a new integrated device for spintronics application, which is based on a hybrid metal-semiconductor structure. The device consists of a Si-based p-i-n photodetector sandwiched between two layers of a ferromagnetic metal (3d ferromagnet or half-metallic compound). The photocurrent flowing in such a system is shown to depend on its magnetic configuration. This, in turn, allows controll...

2001
Peter Gutmann

A paper published in 1996 examined the problems involved in truly deleting data from magnetic storage media and also made a mention of the fact that similar problems affect data held in semiconductor memory. This work extends the brief coverage of this area given in the earlier paper by providing the technical background information necessary to understand remanence issues in semiconductor devi...

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