In manufacturing-cell-formation research, a major concern is to make groups of machines into machine cells and parts part families. Extensive work has been carried out in this area using various models techniques. Regarding these ideas, paper, experiments with varying parameters the popular metaheuristic algorithm known as genetic have bi-criteria objective function: minimization intercell move...

Abstract Composite structures play an important role in realising resource-efficient products. Their high lightweight potential and improved manufacturing technologies lead to increased use high-volume However, especially during the design development of products, consideration uncertainties is essential guarantee final product quality. In this context, modern materials, such as fibre reinforce...

— Various model parameter calculation equations of RF CMOS inductors are compared. The calculation equations are using as variables either Y, Z-parameters or S-parameters. Results are based on on-wafer RF S-parameter measurements of a 3.75 turn spiral inductor fabricated in AMIS 0.7 μm CMOS DM1P n-well technology. Results obtained with calculation equations for a differentially driven inductor ...

We develop a covariance-matrix-based uncertainty analysis for vector-network-analyzer scattering-parameter measurements. The covariance matrix captures all of the measurement uncertainties and statistical correlations between them. This allows the uncertainties of vector-network-analyzer scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from s...

An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of mea...