نتایج جستجو برای: nano metrology

تعداد نتایج: 55232  

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه صنعتی خواجه نصیرالدین طوسی 1390

فرآیند ماشینکاری به روش تخلیه الکتریکی( edm)، یکی از فرآیندهای نوین ماشینکاری است که کاربردهای متنوعی در ساخت و تولید محصولات میکرومتری دارد. رشد و توسعه نانوتکنولوژی و نیاز به بهره گیری از روشهای جدید موجب شده است که جذبه زیادی برای استفاده از فرآیند edm در ساخت و تولید محصولات نانومتری ایجاد شود. فرآیند nano-edm یک فرآیند ماشینکاری حرارتی است که در آن از انرژی حرارتی حاصل از جرقه الکتریکی برا...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه پیام نور - دانشگاه پیام نور استان همدان - دانشکده ادبیات و علوم انسانی 1390

abstract this study is an attempt to determine the effect of nano- technology education on science lesson for fifth grade in primary school in the city of kermanshah. this research is experimental and is conducted in the from of pre-test and post- test for the control group. an achievement test was administered to determine the rate of learning in the students. the research is an applied one. ...

1993
Theodore H. Hopp

Coordinate measuring systems (CMSs) assess length-based characteristics of mechanical parts by measuring points on the part surface and analyzing the point data. Data analysis software can contribute significantly to the total measurement error of a CMS. Factors affecting software performance include the choice of analysis method, the quality of the software, and characteristics of the specific...

1997
D J Whitehouse

Some important types of instrumentation for measuring surfaces both past and present are reviewed. Exhaustive lists of instruments and performance are not presented; rather more emphasis is placed on the philosophy of measurement. An attempt is made to classify the surface features and also the function of surfaces as a pre-requisite to measurement. It is revealed that, as the push towards mini...

2008
R. E. Barry T. W. Burgess M. Menon A. Slotwinski R. Sebastian

The plasma facing surfaces in ITER must be aligned to millimeter accuracy with respect to the magnetic flux surfaces to prevent impurity influx into the plasma and to avoid component damage. Checking of in-vessel component alignment during initial assembly, operation, and subsequent maintenance is anticipated. A fully remote metrology system is necessary, particularly since major remote operati...

Journal: :Physical Review A 2019

Journal: :AVS Quantum Science 2020

Journal: :Nature Photonics 2013

Journal: :Journal of Research of the National Bureau of Standards 1981

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