نتایج جستجو برای: semiconductor device testing

تعداد نتایج: 1029873  

2001
Yiming Li Cheng-Kai Chen Shui-Sheng Lin Jinn-Liang Liu S. M. Sze

A new parallel semiconductor device simulation using the dynamic load balancing approach is presented. This semiconductor device simulation based on adaptive finite volume, error estimation, and monotone iterative methods has been developed and implemented on a Linux-cluster with MPI library. Two different parallel versions of the algorithm to perform a complete device simulation are proposed. ...

2016
Ashutosh sahu Priyanka sharma

-Memristor is the fourth fundamental passive element after resistor, inductor and capacitor. Memristor is memory resistor which is two terminal device. This semiconductor device is statistically proved by a student in china Leon Chua in 1971. And discovered by scientist. R.Stanley Williams and its team in April 30,2008 in lab of HP. It consist a semiconductor of titanium dioxide in which one ha...

Journal: :IEEJ Transactions on Electronics, Information and Systems 1987

1999
Olaf Schenk Wolfgang Fichtner

We present PARDISO, a new scalable parallel sparse direct linear solver on shared memory multiprocessors. In this paper, we describe the parallel fac-torization algorithm which utilizes the supernode structure of the matrix to reduce the number of memory references with Level 3 BLAS. We also propose enhancements that signiicantly reduce the communication rate for pipelining parallelism. The res...

Journal: :Proceedings of the IEE - Part B: Electronic and Communication Engineering 1959

Journal: :Journal of the Japan Society for Precision Engineering 2007

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید