The cumulative count of a conforming (CCC) control chart is used for high quality processes.The CCC − r chart is an improvement of the CCC chart that is based on the cumulative number of items inspected until observing r non-conforming ones. This paper aims to propose a new approach for manufacturer’s decision making according to the criteria among the available options. The o...

C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

This paper presents the economic design of modified X chart for autocorrelated data and comparison with the economic design of Shewhart’s X chart. An attempt has been made to counter autocorrelation by designing the modified X chart; as the cost of operating a process control system is an important element in the economic design of control charts. The economic designs of both modified and Shewh...

w w w . i j c s t . c o m InternatIonal Journal of Computer SCIenCe and teChnology 69 Abstract The State Chart Diagrams are used for analyzing the dynamic behavior of system. The understandably of State Chart Diagrams are important for the effective and clear communication among developers. In this paper we, propose a cohesion and coupling , as Average Cohesiveness of States (ACOS) and Average ...

c-Chart was frequently used to monitor wafer defects during IC manufacturing. The clustering degree of defect on a wafer will increase along with the area of wafer gradually enlarging. The defect clustering causes the Poisson-based c-chart to exhibit many false alarms. Although several revised control charts have been developed to reduce the number of false alarms, those control charts still ha...

This paper gives an introduction to a multifor-malism modeling methodology which is based on the DEVS-formalism. Several extensions to DEVS like DEVS with conditional events, combined discrete continuous models, and variable structure coupled models are discussed. Model development is supported by a methodology which employs message sequence charts and hierarchical state transition diagrams. Th...

preparing thermal comfort conditions in outdoor public spaces is one of the considerations of architectural design. if the constructed area does not support comfortable conditions in outdoor spaces, it will cause microclimatic problems for pedestrians and adjacent buildings. regarding the different thermal comfort conditions in outdoor spaces in comparison with indoor, several indices have been...

BACKGROUND Long-term monitoring in bipolar affective disorders constitutes an important therapeutic and preventive method. The present study examines the validity of the Personal Life-Chart App (PLC App), in both German and in English. This App is based on the National Institute of Mental Health's Life-Chart Method, the de facto standard for long-term monitoring in the treatment of bipolar diso...