C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

quality control plays an important role in increasing the product quality. fuzzy control charts are more sensitive than shewhart control chart. hence, the correct use of fuzzy control chart leads to producing better-quality products. this area is complex because it involves a large scope of industries, and information is not well organized. in this research, we provide a literature review of th...

in this paper, first the available single charting methods, which have been proposed to detect simultaneous shifts in a single process mean and variance, are reviewed. then, by designing proper simulation studies these methods are evaluated in terms of in-control and out-ofcontrol average run length criteria (arl). the results of these simulation experiments show that the ewma and ewms methods ...

In statistical process control, the primary method used to monitor the number of nonconformities is the c-chart. The conventional c-chart is based on the assumption that the occurrence of nonconformities in samples is well modeled by a Poisson distribution. When the Poisson assumption is not met, the X-chart (individuals chart) is often used as an alternative charting scheme in practice. In thi...

in this research, an iterative approach is employed to recognize and classify control chart patterns. to do this, by taking new observations on the quality characteristic under consideration, the maximum likelihood estimator of pattern parameters is first obtained and then the probability of each pattern is determined. then using bayes’ rule, probabilities are updated recursively. finally, when...

A manufacturing process cannot be released to production until it has been proven to be stable. Also, we cannot begin to talk about process capability until we have demonstrated stability in our process. This means that the process variation is the result of random causes only and all assignable or special causes have been removed. In complicated manufacturing processes, such as drilling proces...