This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framework, we first define a test of minimal size that can isolate multiple simultaneous faults of an arbitrary nature. Second, we prove complexity results for multiplefault tests of minimal size in propositional system model...

The method of alternating inputs is an interesting combination of time-and hardware-redundancy for error detection of self-dual circuits. In this paper it is shown how a combinational self-dual circuit can be transformed into a self-dual fault-secure circuit. For 82% of the benchmark circuits the necessary average area overhead is only 8,81%. A self-dual circuit is called self-dual fault-secure...

This paper describes a model-based, feedforward control scheme that can detect faults in the controlled process and improve control performance over traditional PID control. The tool uses static simulation models of the system under control to generate feed-forward control action, which acts as a reference of correct operation. Faults that occur in the system cause discrepancies between the fee...

In this paper, a new algorithm and a new BIST structure for efficiently testing dual port memories that is used widely as embedded memory, is proposed. The proposed test algorithm is able to detect the dual port memories faults and has shorter test time and the test patterns in comparison to existing test algorithms. In addition, the presented BIST has efficient structure that requires lesser h...

This paper presents two linear tests for unique faults in dual-port SRAMs: a single-addressing tests (March s2PF-), and a double-addressing test (March d2PF-). The faults for which the tests are designed are developed using defect injection and circuit simulation of all possible resistive defects at the electrical level. An analytical as well as an industrial evaluation of the two tests, togeth...

Changes in the physicochemical conditions of process unit, even under control, may lead to what are generically referred to as faults. The cognition of causes is very important, because the system can be diagnosed and fault tolerated. In this article, we discuss and propose an artificial neural network that can detect the incipient and gradual faults either individually or mutually. The mai...

Software testing Resource allocation and release time decisions are vital for the software systems. The objective behind such critical decisions may differ from firm to firm. The motive of the firm may be maximization of software reliability or maximization of number of faults to be removed from each module or it may be minimization of number of faults remaining in the software or minimization ...

A low-degree dual-cube was proposed as an alternative to the hypercubes. A dual-cube DC(m) has m + 1 links per node, where m is the degree of a cluster (m-cube) and one more link is used for connecting to a node in another cluster. There are 2 clusters and hence the total number of nodes in a DC(m) is 2 + . In this paper, by using Gray code, we show that there exists a fault-free cycle containi...

1 This paper presents a method of using hardware redundancy to ease the problem of fault testing in sequential logic networks. Sequential logic networks are constructed using two kinds of dual-mode logic gates, one of which is specifically required to initialize a feedback loop to some logic value. Initially, it is shown that these networks can be tested for all single stuck-at-faults with six ...