changes in the physicochemical conditions of process unit, even under control, may lead to what are generically referred to as faults. the cognition of causes is very important, because the system can be diagnosed and fault tolerated. in this article, we discuss and propose an artificial neural network that can detect the incipient and gradual faults either individually or mutually. the main fe...

ÐThis paper begins with an overview of realistic fault models for dual-port memories, divided into single-port faults and faults unique for dual-port memories. The latter faults cannot be detected with the conventional single-port memory tests; they require special tests. A precise notation for all faults, such that ambiguities and misunderstandings will be prevented, has been emphasized. Next,...

Meyer and Pradhan proposed the MS (for “mixed-sum”) algorithm to solve the Byzantine Agreement (BA) problem with dual failure modes: arbitrary faults (Byzantine faults) and dormant faults (essentially omission faults and timing faults) [3]. Our study indicates that this algorithm uses an inappropriate method to eliminate the effects of dormant faults and that the bound on the number of allowabl...

The testability problem of dual port memories is investigated. Architectural modifications to enhance the testability by allowing multiple access of memory cells with minimal overhead on both silicon area and device performance are described. New fault models are proposed and efficient O( n ) test algorithms are described for both the memory array and the address decoders. The new fault models ...

Youngkyu Park et al. 555 This paper proposes a test algorithm that can detect and diagnose all the faults occurring in dual-port memories that can be accessed simultaneously through two ports. In this paper, we develop a new diagnosis algorithm that classifies faults in detail when they are detected while the test process is being developed. The algorithm is particularly efficient because it us...

Different aspects of modeling faults in dynamic systems are considered in connection with reliable control (RC). The fault models include models with additive faults, multiplicative faults and structural changes in the models due to faults in the systems. These descriptions are considered in connection with reliable control and feedback control with fault rejection. The main emphasis is on faul...

This paper presents a method of using hardware redundancy to ease the problem of fault testing in combinational logic networks. Combinational logic networks are constructed using dual-mode logic gates. Initially, it is shown that these networks can be tested for all single stuck-at-faults using just two function-independent tests. This method is then extended to detect a large class of multiple...