We discuss the test scheduling problem in this paper. We first provide a historical perspective of the original test scheduling formulation that dealt only with resource conflicts, followed by the consideration of power constraint test scheduling. We then move on to the recent formulations which include dealing with thermal constraint. We explain solutions, their limitations and the challenges ...

Interconnect will be a major bottleneck for deep sub-micron technologies in the years to come. This dissertation addresses the communication aspect from a power consumption and transmission speed perspective. A model for the energy consumption associated with data transmission through deep sub-micron technology buses is derived. The capacitive and inductive coupling between the bus lines as wel...

This paper proposes a realistic memory fault probability model which predicts the probabilities of memory fault classes for a given process technology. Physical defects in the memory array are classified into five functional fault classes, which are stuck-at, stuck-open, transition, coupling, and data retention faults. Finally, the memory fault coverages of the known memory test algorithms are ...

This work introduces a numerical method to iteratively extract parameters of rectangular parallelepiped (RPP) sensitive volume (SV) from experimental proton direct ionization (PDI) SEU data. The combines two separate models. first model estimates the average linear energy transfer (LET) values for energetic ions, including protons and also heavy in elemental solid targets. second describes stat...

Rohit Kapur Thomas W. Williams Synopsys Inc. P lay the word association game with electronics, and the first words that come to mind might be “inexpensive” and “reliable.” Everyone expects electronic items to become continually less expensive and quickly outdated. We also expect them to work when we bring them home. Do any of us ever question how and why this happens? A large part of the answer...

As transistor geometries are reduced, leakage current increases. Due to increased levels and process variation, IDDQ test faces difficult challenges for deep sub-micron technologies. Several solutions have been proposed in the literature. This paper provides an overview of some of the solutions. Some views on the future of IDDQ testing are also presented.

Implantable image sensors have several biomedical applications due to their miniature size, light weight, and low power consumption achieved through sub-micron standard CMOS (Complementary Metal Oxide Semiconductor) technologies. The main applications are in specific cell labeling, neural activity detection, and biomedical imaging. In this paper the recent research studies on implantable CMOS i...