due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

We present a simple and accurate model to compute the power dissipated in sub-micron CMOS buffers driving RC interconnect lines. The expression obtained accounts for the main effects in current sub-micron CMOS technologies as carrier velocity saturation effects, input-output coupling capacitor, output load, input slew time, device sizes and interconnect resistance. Results are compared to HSPIC...

Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

Two different low-energy proton (LEP) test methods, one with quasi-monoenergetic (QME) and the other very wide beam energy spectra, have been studied. The two methodologies applied to devices that were suggested from prior heavy-ion tests be sensitive direct ionization (PDI). advantages disadvantages of methods are discussed. method using QME beams requires device preparation high-energy resolu...

Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-100 mA of a single core. Nevertheless this is not sufficient to handle the next generations of very deep sub-micron technologies. Moreover delay-fault testing and very-low voltage testing are not a real alternative for ...

Enabling fluids to be manipulated on the micron-scale, microfluidic technologies have facilitated major advances in how we study cells. In this review, we highlight key developments in how flow in microfluidic devices is exploited to investigate the behavior of individual cells, from trapping and positioning single cells to probing cell deformability. Exploiting the properties of fluids and flo...

A variety of prebiotic syntheses starting from reduced and gas precursors, or small reactive organic intermediates produce a variety of micron and sub-micron sized organic microstructures, including spheres, filaments and toroids. Many of these structures are hollow, and they display dynamic and reversible self-assembly. We report here some of their physical characteristics that might be compat...

Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to further increase in junction temperatures, possible thermal run away, and yield-loss of good parts. Calculations show that the junction temperature is increasing by 1.45X/generation. This paper estimates the increase in jun...