نتایج جستجو برای: semiconductor device testing

تعداد نتایج: 1029873  

Journal: :Microelectronics Reliability 2014
Mauro Ciappa Emre Ilgünsatiroglu Alexey Yu. Illarionov

Evaluation techniques for semiconductor devices are keys for device development with low cost and short period. Especially, dopant and depletion layer distribution in device is critical for electrical property of the device and is needed to be evaluated. Super-higher-order nonlinear dielectric microscopy (SHO-SNDM) is one of the promising techniques for semiconductor device evaluation. We devel...

A. H. Yuwono A. Ridhova A. Udhiarto N. Sofyan R. A. Nugraha

One of the possibilities to mass-produce dye-sensitized solar cell (DSSC) device is if it could be embedded to the area atop metal roof. However, the use of metal substrate is constrained by the corrosion caused by the electrolyte solution used in the DSSC device such as iodide/tri-iodide (I-/I3-). In this study, we propose the utilization of polyaniline/reduced graphene o...

1998
Keith Baker

Philips Semiconductor is a supplier to a wide range of markets for analogue and mixed-signal consumer ICs. These products extend from the simplest form of linear products to advanced VLSI analogue systems such as the One-Chip TV. For new mixed-signal products Philips has started to adopt a strategy of testing similar to that used for digital ICs. This is based on efficiently proving the product...

Journal: :Bulletin of the Japan Institute of Metals 1992

Journal: :journal of nanostructures 2013
m. mazloum-ardakani m. yavari a. r. khoshroo

colloidal quantum dots offer broad tuning of semiconductor band structure via the quantum size effect. in this paper, we present a detailed investigation on the influence of the thickness of colloidal lead sulfide (pbs) nanocrystals (active layer) to the photovoltaic performance of colloidal quantum dot solar cells. the pbs nanocrystals (qds) were synthesized in a non-coordinating solvent, 1-oc...

2016
A. Aboushady K. H. Ahmed D. Jovcic

This paper focuses on the behaviour of the cell capacitor discharge currents during DC faults in half-bridge modular multilevel converters. Active switches, not designed for fault conditions, are tripped to minimize discharge currents effect on the semiconductor switches. Two levels of device protection are commonly in place; driver level protection monitoring collector-emitter voltage and over...

2001
Carl L. Gardner

incorporate hundreds of millions of semiconductor devices (transistors, diodes, optical devices, etc.). To predict the performance of the VLSI circuits, the current-voltage (I-V) characteristics of the semiconductor device are required. Semiconductor device simulation codes provide a way of predicting I-V curves as device parameters are varied, without having to fabricate the device first. (The...

2001
YIMING LI

In this paper, we solve numerically a semiconductor device energy balance equation using monotone iterative method. With the proposed solution technique, we prove the solution of ̄nite volume discretized semiconductor device energy balance equation converges monotonically. The method presented here provides an e± cient approach for the numerical solution of energy balance equation in submicron ...

2003
Pei-Cheng Ku

Semiconductor Slow-Light Device

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